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 Testing Center of Beijing Century Goldray Semiconductor Co., LTD. 

  

   We have imported many testing and inspecting equipments with the latest high tech from abroad.
Now we are applying for becoming the national testing center, and contract projects openly for the below testing items:



Testing Items

Equipments

Standard

Testing Grade

Testing Results

Type

Raman spectra instrument

Q/DXHJC00092014 Appendix C

≤0.65/cm

show the result of Raman spectra of the testing point; or the area percentage of wafer in differ types.

 

LabRAM HR800

Resistivity Semi-insulating

Non-Touch High-R resistivity testing instrument

Q/DXHJC00102014 Appendix E

100Ωcm

show the resistivity value of the wafer. Mapping (1051012Ω·cm)

CREAMA-WT

Resistivity Conductive

Low-R resistivity testing instrument

Q/DXHJC00092014

Appendix D

/

show the resistivity value of the testing point.

EG-101P

(0.01Ω·cm0.5Ω·cm)

Micro pipe

Polarizing microscope

Q/DXHJC00092014 Appendix E

/

show the density of micro-pipe of the SiC wafer

BX51

(pcs/cm2)

TTV

TTV Testing Instrument

TTV testing follows GB/T 30867-2014;

Warp testing follows GB/T 6620-2009.

0.1μm

TTVTIRLTVBowWarp

Flat Master-200

(μm)

Roughness

Atomic Force Microscope

Q/DXHJC00092014 Appendix B

≤0.5A

RaRq

Bruker Edge

(nm)

Diameter

Dial caliper

Testing follows GB/T 30866-2014

0.02mm

D

16286

(mm)

Thickness

Thickness measuring instrument

Testing follows GB/T 30867-2014

0.1um

h

EG-101P

(mm)

Orientation

X-ray Orientator

Testing follows GB/T 1555-2009

±30"

/

DX-7B

(°)

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